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| 2N3227 Silicon NPN Transistor Data Sheet Description Semicoa Semiconductors offers: * Screening and processing per MIL-PRF-19500 Appendix E * JAN level (2N3227J) * JANTX level (2N3227JX) * JANTXV level (2N3227JV) * JANS level (2N3227JS) * QCI to the applicable level * 100% die visual inspection per MIL-STD-750 method 2072 for JANTXV and JANS * Radiation testing (total dose) upon request Applications * High-speed switching transistor * Low power * NPN silicon transistor Features * * * * Please contact Semicoa for special configurations www.SEMICOA.com or (714) 979-1900 Hermetically sealed TO-18 metal can Also available in chip configuration Chip geometry 0005 Reference document: MIL-PRF-19500/317 Benefits * Qualification Levels: JAN, JANTX, JANTXV and JANS * Radiation testing available TC = 25C unless otherwise specified Absolute Maximum Ratings Parameter Collector-Emitter Voltage Collector-Base Voltage Emitter-Base Voltage Power Dissipation, TA = 25C Derate linearly above 25C Thermal Resistance Operating Junction Temperature Storage Temperature Symbol VCEO VCBO VEBO PT Rating 20 40 6 0.36 2.06 325 -65 to +200 -65 to +200 Unit Volts Volts Volts mW mW/C C/W C C RJA TJ TSTG Copyright 2002 Rev. J Semicoa Semiconductors, Inc. 333 McCormick Avenue, Costa Mesa, California 92626 714.979.1900, FAX 714.557.4541 Page 1 of 1 www.SEMICOA.com 2N3227 Silicon NPN Transistor Data Sheet ELECTRICAL CHARACTERISTICS characteristics specified at TA = 25C Off Characteristics Parameter Collector-Emitter Breakdown Voltage Collector-Base Cutoff Current Collector-Emitter Cutoff Current Collector-Emitter Cutoff Current Emitter-Base Cutoff Current On Characteristics Parameter Symbol hFE1 hFE2 hFE3 hFE4 hFE5 VBEsat1 VBEsat2 VBEsat3 VBEsat4 VBEsat5 VCEsat1 VCEsat2 VCEsat3 VCEsat4 Symbol |hFE| COBO CIBO ts tON tOFF Symbol V(BR)CEO ICBO1 ICBO2 ICBO3 ICEX ICES IEBO1 IEBO2 Test Conditions IC = 10 mA VCB = 40 Volts VCB = 32 Volts VCB = 20 Volts, TA = 150C VCE= 10Volts, VEB= 0.25Volts TA = 125C VCE = 20 Volts VEB = 6 Volts VEB = 4 Volts Test Conditions IC = 10 mA, VCE = 0.35 Volts IC = 30 mA, VCE = 0.4 Volts IC = 10 mA, VCE = 1 Volts IC = 100 mA, VCE = 1 Volts IC = 10 mA, VCE = 1 Volts TA = -55C IC = 10 mA, IB = 1 mA IC = 30 mA, IB = 3 mA IC = 100 mA, IB = 10 mA IC= 10mA, IB= 1mA,TA=+125C IC= 10mA, IB= 1mA, TA = -55C IC = 10 mA, IB = 1 mA IC = 30 mA, IB = 3 mA IC = 100 mA, IB = 10 mA IC= 10mA, IB= 1mA,TA=+125C Test Conditions VCE = 10 Volts, IC = 10 mA, f = 100 MHz VCB = 5 Volts, IE = 0 mA, 100 kHZ < f < 1 MHz VEB = 0.5 Volts, IC = 0 mA, 100 kHZ < f < 1 MHz IC = 10 mA, IB1=IB2 = 10 mA IC = 10 mA, IB1= 3 mA, IB2 = 1.5 mA IC = 10 mA, IB1= 3 mA, IB2 = 1.5 mA Min 20 10 0.2 30 30 400 10 0.25 Min 70 40 75 30 20 0.70 0.80 0.50 Typ Max 250 250 300 150 0.85 0.90 1.20 1.02 0.20 0.25 0.45 0.30 Min 5 Typ Max 10 4 4 18 12 25 pF pF ns ns ns Typ Max Units Volts A A nA A Pulse Test: Pulse Width = 300 s, Duty Cycle 2.0% Units DC Current Gain Base-Emitter Saturation Voltage Volts Collector-Emitter Saturation Voltage Dynamic Characteristics Parameter Magnitude - Common Emitter, Short Circuit Forward Current Transfer Ratio Open Circuit Output Capacitance Open Circuit Input Capacitance Storage Time Saturated Turn-On Time Saturated Turn-Off Time Volts Units Copyright 2002 Rev. J Semicoa Semiconductors, Inc. 333 McCormick Avenue, Costa Mesa, California 92626 714.979.1900, FAX 714.557.4541 Page 2 of 2 www.SEMICOA.com |
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